| Cover Story 1 |
 301K
|
How to Work the Defective LSI
|
| 534K
|
Chapter1 Design and Verification of LSI
Comparing the Design Routines of FPGA and ASIC
|
pp.20-25
|
| 547K
|
Chapter2 Basics of Simulation
A Tutorial Using Quartus II and ModelSim
|
pp.26-34
|
| 281K
|
Chapter3 Timing Verification of FPGA
A Tutorial Using Quartus II
|
pp.35-40
|
| 357K
|
Chapter4 Using FPGA's Internal Microprocessor for Functional Verification
Verification of UART Core and DDR Memory Controller as Example
|
pp.41-50
|
| 369K
|
Chapter5 Utilizing FPGA's Internal Logic Analizer Tool
Verification of the PCI Interface Using ChipScope
|
pp.51-59
|
| 333K
|
Chapter6 Utilizing FPGA's Internal Logic Analizer IP
Verification Example of the SDRAM Controller and Application for Remote Debugging
|
pp.60-67
|
| Cover Story 2 |
| 89K
|
"The Right Thing in the Right Place" in Memory Devices
|
| 511K
|
Chapter1 How to Use DRAM ?
Technology for Improving Performances and How to Make Good Use of Them
|
pp.70-81
|
| 354K
|
Chapter2 Understanding the Movements of DDR SDRAM
Added and Deleted Functions to DDR SDRAM
|
pp.82-93
|
| 303K
|
Chapter3 Would 1Transistor Pseudo SRAM Bloom in Mobile Device Field?
One Answer for the Market Demand for Battery Longevity and High Density
|
pp.94-98
|
| Seminar |
| 350K
|
Understanding the Outlines of the Development Flow and Language Syntax
Verilog-AMS Practical Modeling Seminar (1)
|
pp.111-119
|
| 405K
|
Translating Digital Signal to Human-friendly Analog Signal - D-A Converter
Introduction to CMOS Analog Circuits (10)
|
pp.120-126
|
| 339K
|
Studying the Mechanism of Microstrip Filter (1)
What Can be Seen with Electromagnetic Field Analysis Software (25)
|
pp.127-133
|
| 397K
|
Hardware Development Utilizing FPGA Prototyping Environment (2)
IP Core Design Know How (6/Final)
|
pp.134-139
|
| 395K
|
Let's Try Writing a Patent Specifications ! (2)
Patent Manual for Electronic Engineers (15)
|
pp.140-145
|
| Generals |
| 494K
|
56% of the Students in Electronics Lab of Japanese University Experiences LSI Design
Research on Industry-University Cooperation in Electronics Technology
|
pp.99-110
|
| 352K
|
Developing a Low Cost LSI Tester Fit for Design for Testability
Applying First for the Verification of DFT Circuit and Test Pattern
|
pp.146-156
|
| Column |
| |
Chinese Market and Microprocessors
|
p.68
|
| |
Engineer's Ranking - Issue of "Trouble Shooting"
Term is Funny (18)
|
p.161
|
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